Product details
| A | Test sphere probe | IEC60529, IEC61032, IEC60335, IEC61029, IEC60745, IEC60065, IEC60950 | Ball diameter:50mm Baffle plate diameter :45mm Baffle plate thickness :4mm Handle diameter :10mm Handle length :100mm Material plastic(delrin)+stainless steel |
| B | Standard Joint test finger | IEC60529 , IEC61032 IEC60335, IEC60884 IEC60745, IEC60045 IEC60950 | Knurled finger diameter :12mm Knurler finger length :80mm Baffle plate diameter: 50mm Baffle plate length :100mm Baffle thickness:20mm |
| C | Test probe C | IEC61032,IEC60529 | Test probe length :100mm Test probe diameter :2.5mm Dam-sphere diameter :35mm Handle diameter :10mm Handle length: 100mm Material nylon(delrin)+ hardened steel |
| D | Test probe D | IEC61032,IEC60529 | Test probe length :100mm Test probe diameter :1mm Dam-sphere diameter :35mm Handle diameter :10mm Handle length: 100mm Material nylon(delrin ) + hardened steel |
Reference Standard:IEC61032 Test Probe A/B/C/D
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